Semiconductor Equipment

SemiconductorPlant.com supplies used semiconductor equipment, wafer fabrication and metrology equipment to customers worldwide. We offer equipment owners or brokers a unique platform to market their surplus equipment, and offer buyers a source for up to date information on equipment available at a fraction of the cost of new. Featured equipment is below - contact us today with equipment you would like to buy or sell.

  • Testing Equipment
    • Resistivity Gauges
      • IEC# 117779 - ADE 6035 Resistivity Gauges (6035) - MicroSense 6035 ADE’s Model 6035 uses non-contact eddy-current probes to accurately measure Bulk Resistivity of wafers. This MicroSense system handles wafers up...
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    • Test Systems
      • IEC# 117782 - Teradyne Model J-971SP Digital Test System. Designed with 64 I/O Channels on the standard system. Channels can be added in increments of 32 up to a maximum of 512. Pattern Depth (This is LVM) 8...
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    • Thickness Gauges
      • IEC# 117780 - ADE 6033 Thickness Gauges (6033T) - MicroSense 6033T The Model 6033T, using ADE’s patented capacitive measurement principle, measures wafers for Thickness and Total Thickness Variation (TVV)....
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  • Wafer Fabrication Equipment
    • Chemical Vapor Depositors
      • IEC# 117796 - Applied Materials Model P5000, Cluster PECVD Tool. Wafer size 150mm with two (2) Oxide Chambers. Capable of Silicide Etching, Software revision level of 4.26. Includes total of two (2) Neslabs...
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      • IEC# 117797 - Applied Materials Model 5000CVD, Cluster PECVD Tool. Wafer size 150mm. Three (3) Process Chambers: Oxide: LH DRYVAC 100S; RUVAC 250. Software Revision Level Boss 4.8; Process Gasses TEOS/O2/C3F8;
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    • Lithography
      • IEC# 117789 - Semix Tazmo Manual Photoresist Coater, wafer size 100-150mm. Two (2) tracks; Four (4) Cassette Elevators; One (1) Photoresist Coat Station; One (1) Photoresist Dispenser; Three (3) Hot Plates;...
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      • IEC# 117788 - Canon EX-4 Deep UV Wafer Stepper, wafer size 100-200mm. Wafer handler size 100mm – 200mm. Reticle Plate Size 6 in x 6 in.; Site to Site Alignment. Software Revision Level is Canon Main 11.08b. ...
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      • IEC# 117787 - Nikon NRS- S2O2A Photolithography Exposure, Deep UV Wafer Stepper, Quantity (1)
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      • IEC# 117790 - Tel Mark 7 'xerogel' designed coater. It has 1 xerogel hotplate that is made to dispense ammonia gas - the ammonia gas is delivered via an ammonium hydroxide/ammonia bubbler. It has one low oxygen...
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      • IEC# 117786 - Nikon NSR 2005i8a I-Line Wafer Stepper, wafer size 100mm – 150mm. Plate size 6in x 6inch. Process track is inline capable. Left interface. Environmental enclosure is provided. Reduction...
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    • Metal Etchers
      • IEC# 117791 - Applied Material Model 8330, wafer size 125mm – 150mm. Plasma Processing Parallel PI Tool. Sale includes: cables, pump cart, recirculator, (1) RF Generator, (1) Generator, (1) Cryo Pump. Purchased...
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    • Other Etchers
      • IEC# 117792 - SEZ Spin Spray Etcher Model RST 100- , backside, 5"-6", set up for 6", This tool includes: (1) acid cabinet, (1) box electrical panel, (3) other crates, 1995 vintage. Quantity (1).
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    • Physical Vapor Depositors
      • IEC# 117793 - MRC 603 Vertical Sputterer, the unit has been removed from service and is currently in inside storage. Purchased in 1985. The exterior dimensions are 201cm wide x 140cm deep x 191cm high.
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    • Wet Processing
      • IEC# 117784 - FSI Aries Cryokinetic Surface Conditioning System, 1998 vintage, equipment is crated and in storage. Quantity (1).
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      • IEC# 117785 - ECI Technology QLC 5000 Electroplating Bath Analyzer. Automatic Online chemical monitoring system, automatic. 74cm wide x 61cm deep x 188cm tall. Quantity (1)
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  • Wafer Metrology Equipment
    • Particle Counters
      • IEC# 117773 - Tencor 7700 Patterned Wafer Inspection System. Can detect defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and...
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      • IEC# 117777 - Estek WIS 850 (WIS 850) - Detection 0.17 um on Silicon at 95% capture rate. Verified by NIST Standards. 2 to 8 inch capable with proper setup. Dark and light channel system. Dark channel is used for...
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      • IEC# 117771 - Tencor 5500 Wafer Particle Monitor. "System is in perfect - like new - condition". Measures surface contamination on unpatterned wafers from 100mm to 200mm diameter. Detects particles as small as...
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      • IEC# 117772 - Tencor 4500 Wafer Contamination Monitor. Measures surface contamination on unpatterned wafers from 50mm to 150mm diameter. Detects particles as small as 0.2 µm in diameter. Identifies particle...
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      • IEC# 117776 - Estek WIS 800 (WIS 800) - Detection 0.22 um on Silicon at 95% capture rate. Verified by NIST Standards. 2 to 8 inch capable with proper setup. Dark and light channel system. Dark channel is used for...
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      • IEC# 117774 - Tencor 7600 delivers critical defect data quickly. A multi-thresholding capability allows a virtually unlimited number of data collection thresholds to be established for different regions of the...
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      • IEC# 117775 - Tencor Surfscan 6420 (Surfscan 6420) - Excellent Condition - Only used a few times; Currently Facilitized in the fab; Capable of 2" - 8" wafers; Low angle optics; Non-Patterned surface Inspection...
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